[A2L-E] R1&4-1

[A2L-E-02] Experimental Investigation of Chatter Switching on High-Side Gate Driver Circuit for DC-DC Converter

*Daisuke Ito², Takuji Kousaka¹, Hiroyuki Asahara³ (1. Chukyo University, 2. Gifu University, 3. Okayama University of Science)

キーワード：chatter switching, bifurcation phenomena, high-side gate driver circuit