〇Toshiaki Koike-Akino¹, Ye Wang¹, Semih Cayci², David S. Millar¹, Keisuke Kojima¹, Kieran Parsons¹ (¹Mitsubishi Electric Research Laboratories (MERL), USA, ²The Ohio State Univ., USA)

Chao Gao, 〇Yan Li, Honghang Zhou, Hongxiang Guo, Jifang Qiu, Xiaobin Hong, Yong Zuo, Jian Wu (Beijing Univ. of Posts and Telecommunications, China)

Keisuke Matsuda, 〇Shota Koshikawa, Masashi Binkai, Tsuyoshi Yoshida, Naoki Suzuki (Mitsubishi Electric Corporation, Japan)

〇Zonglong He, Yukui Yu, Tianwai Bo, Hoon Kim (KAIST, Republic of Korea)

〇Grzegorz Stepniak (Warsaw Univ. of Technology, Poland)