Xuwei Xue, Kristif Prifti, Bitao Pan, Fulong Yan, Xiaotao Guo, 〇Nicola Calabretta (Eindhoven Univ. of Technology, The Netherlands)

〇Akihiro Fujimoto¹, Yusuke Hirota², Hideki Tode³ (¹Wakayama Univ., Japan, ²National Institute of Information and Communications Technology, Japan, ³Osaka Prefecture Univ., Japan)

〇Kiyo Ishii, Shu Namiki (National Institute of Advanced Industrial Science and Technology (AIST), Japan)

〇Paul Gunning (BT Applied Research, UK)