OECC/PSC 2019

Presentation information

Oral Sessions

Joint session of O4, O5 and P1

[J1] Photonic Integration Circuits I

Thu. Jul 11, 2019 9:00 AM - 10:30 AM Room B (409+410, 4F, Fukuoka International Congress Center)

Presider: Shigeru Nakamura (NEC Corporation, Japan)

10:15 AM - 10:30 AM

[J1-4] All-Optical Performance Characterization of Silicon Mach–Zehnder Modulator for Wafer-Level Test

〇Hiroshi Fukuda, Yoshiho Maeda, Toru Miura, Shinji Matsuo (NTT Corporation, Japan)

Keywords:Optical modulators, Photonic integrated circuits, Photonics-Electronics integration

We have developed a new test method for optical modulator performance characterization that does not require electrical signal input. The modulator is modulated by the photovoltage generated from a photodiode fabricated near the modulator. This method has the potential to remove high-frequency signal lines in a testing system and enables simplification of wafer-level tests in the mass production of photonics devices.

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