Oral Session 6

Wed. Apr 24, 2019 3:30 PM - 5:30 PM 213 (Pacifico Yokohama Conference Center)

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3:30 PM - 4:10 PM

[OPTM-6-01] Polarization camera performance optimization

*Nathan Hagen¹, Shuhei Shibata¹, Yukitoshi Otani¹ (1. Utsunomiya University)

4:10 PM - 4:30 PM

[OPTM-6-02] Snapshot imaging polarimetry based on structured interference fringes

*Daesuk Kim¹, Vamara Dembele¹ (1. Chonbuk National University)

4:30 PM - 4:50 PM

[OPTM-6-03] Spectroscopic Ellipsometry Study on Aluminium-Doped Zinc Oxide Thin Films Prepared via DC Magnetron Sputtering and HiPIMS.

Donyawan Chittinan¹, Tossaporn Lertvanithphol², Kittikhun Seawsakul³, Prayoon Songsiriritthigul³, Phitsanu Poolcharuansin⁴, Mati Horprathum², *Prathan Buranasiri¹ (1. King Mongkut's Institute of Technology Ladkrabang, 2. National Electronics and Computer Technology Center, National Science and Technology Development Agency , 3. Suranaree University of Technology, 4. Mahasarakham University)

4:50 PM - 5:10 PM

[OPTM-6-04] Imaging ellipsometry of porous silicon

*Lianhua Jin¹, Taiki Akiyama¹, Yuki Iizuka¹, Eiichi Kondoh¹, Bernard Gelloz² (1. University of Yamanashi, 2. Nagoya University)

5:10 PM - 5:30 PM

[OPTM-6-05] Effect of oxide layer thickness on polarization mitigation

*Suchandra Banerjee¹, Russell Chipman², Nathan Hagen¹, Yukitoshi Otani¹ (1. Utsunomiya University, 2. University of Arizona)