Session information

XOPT2019

Oral Presentation

XFEL diagnostics

Wed. Apr 24, 2019 10:30 AM - 11:15 AM 313+314 (Pacifico Yokohama Conference Center)

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10:30 AM - 10:45 AM

[XOPT-4-01] Characterization of single shot spectrum of LCLS by using high resolution single shot spectromter and machine learning

*Takahiro Sato^1,2, Hasan Yavas¹, Yanwen Sun^1,2, Yuichi Inubushi^2,3, Makina Yabashi^2,3, Diling Zhu^1,2 (1. LCLS, SLAC National Accelerator Laboratory, 2. SPring-8 center, RIKEN, 3. JASRI)

10:45 AM - 11:00 AM

[XOPT-4-02] Investigating FEL sources: a joint approach of Wavefront sensing, Metrology characterization, and WISEr simulations.

*Michele Manfredda¹, Lorenzo Raimondi¹, Marco Zangrando¹, Nicola Mahne¹ (1. Elettra - sincrotrone trieste s.c.p.a)

11:00 AM - 11:15 AM

[XOPT-4-03] Diffraction in strongly bent crystals: applicability of the kinematical theory

Vladimir Kaganer¹, *Ilia Petrov², Liubov Samoylova² (1. Paul-Drude-Institut für Festkörperelektronik, 2. European XFEL GmbH)

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