*Mengyue Zhang¹, Bin Lin¹ (1. Zhejiang University of China)

*Changda Xu¹, Xiang Zhou¹, HuanHuan Li (1. XI'AN JIAOTONG UNIVERSITY)

Yen Chung Wang, *Jing-Sheuan Lin², Chun-Jen Weng¹, Pi-Ying Cheng² (1. Instrument Technology Research Center, National Applied Research Laboratories, 2. Department of Mechanical Engineering, National Chiao Tung University)

*Maxim Trigub¹, Nikolay Vasnev¹, Vasiliy Vlasov¹ (1. V.E. Zuev Institute of Atmospheric Optics SB RAS)

*Youngbin Na¹, Do-Kyeong Ko¹ (1. Gwangju Institute of Science and Technology)

*KOUSTAV DEY¹, SOURABH ROY¹, M SAI SHANKAR¹, B RAMESH KUMAR², P KISHORE¹ (1. NATIONAL INSTITUTE OF TECHNOLOGY, WARANGAL, INDIA, 2. INSTITUTE FOR PLASMA RESEARCH, GANDHINAGAR,GUJRAT, INDIA)

*Ryoichi Kuwano¹, Makoto Hino¹, Tsuyoshi Tokunaga², Sho Morita², Yukitoshi Otani³ (1. Hiroshima Institute of Technology, 2. Chiba Institute of Technology, 3. Utsunomiya University Center for Optical Research & Education)

Bogdan Sokolenko¹, *Andrey Prisyajniuk¹, Dmitrii Poletaev¹, Nataliya Shostka¹, Ismail Ismailov¹ (1. V.I. Vernadsky Crimean Federal University)

Wei-Jei Peng¹, Cheng-Fang Hoi¹, *Ting-Ming Huang¹, Yuan-Chieh Cheng¹, Fong-Zhi Chen¹ (1. INSTRUMENT TECHNOLOGY RESEARCH CENTER)

*Yushi Chu^1,2, Shaghik Atakaramians², Runan Zhang¹, Desheng Fan², Gui Xiao², Xinghu Fu^2,3, Shuen Wei², Bowen Zhang², Yuan Tian², Zhanyu Ma¹, Quan Chai¹, Jing Ren¹, Yanhua Luo², Jianzhong Zhang¹, Gang-Ding Peng² (1. Harbin Engineering University, 2. University of New South Wales, 3. Yanshan University)

Rou-Jhen Chen¹, Yu-Hsuan Lin¹, Hsin-Yi Tsai¹, Kuo-Cheng Huang¹, *Chun-Han Chou¹ (1. 1.National Applied Research Laboratories, Instrument Technology Research Center)

*wei han^1,2, Min Huang^1,2, Qisheng Cai^1,2, Xiangning Lu^1,2 (1. Academy of Opto-Electronics,Chinese Academy of Sciences, 2. Key Laboratory of Computational Optical Imaging Technology,Chinese Academy of Sciences)

Vladimir Yurievich Venediktov¹, *Vladislav Alexandrovich Sheroshenko¹, K N Gavril’eva¹, A A Sevryugin¹, A Mermoul¹ (1. Saint-Petersburg Electrotechnical University LETI)

*Alina Yu. Tkachenko¹, Ivan A. Lobach¹ (1. Institute of Automation and Electrometry SB RAS)