Imaging III

2019年4月25日(木) 13:30 〜 15:00 313+314 (Pacifico Yokohama Conference Center)

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13:30 〜 14:00

[XOPT-12-01] High-Resolution Full-Field X-Ray Microscope Based on Multilayer Advanced Kirkpatrick-Baez Mirror Optics

*Satoshi Matsuyama¹ (1. Osaka University)

14:00 〜 14:15

[XOPT-12-02] Femtosecond soft x-ray imaging based on grazing incidence objective mirrors

*Satoru Egawa¹, Hiroto Motoyama², Gota Yamaguchi¹, Shigeki Owada³, Yuya Kubota³, Yusuke Matsuzawa¹, Takehiro Kume¹, Makina Yabashi⁴, Hidekazu Mimura¹ (1. Department of Precision Engineering, Graduate School of Engineering, The University of Tokyo, 2. Department of Chemistry, Graduate School of Science, The University of Tokyo, 3. Japan Synchrotron Radiation Research Institute, 4. RIKEN SPring-8 Center)

14:15 〜 14:30

[XOPT-12-03] 3D nanoscale chemical state speciation with X-ray ptychographic spectroscopy

*Zirui Gao¹, Johannes Ihli¹, Michal Odstrcil¹, Mirko Holler¹, Jeroen Anton van Bokhoven¹, Sebastian Böcklein², Gerhard Mestl², Manuel Guizar-Sicairos¹ (1. Paul Scherrer Institute, 2. Clariant SE)

14:30 〜 14:45

[XOPT-12-04] High-resolution coherent diffraction imaging with synchrotron radiation and XFELs

*Huaidong Jiang¹, Jiadong Fan¹, Zhibin Sun¹, Shengkun Yao¹, Yajun Tong¹ (1. ShanghaiTech University)

14:45 〜 15:00

[XOPT-12-05] Hartmann wavefront sensors and adaptive optics for EUV and X-rays

*Rakchanok Rungsawang¹, Ombeline de La Rochefoucauld¹, Guillaume Dovillaire¹, Fabrice Harms¹, Mourad Idir², Dietmar Korn¹, Xavier Levecq¹, Martin Piponnier¹, Philippe Zeitoun³ (1. Imagine Optic, 2. Brookhaven National Laboratory, 3. Laboratoire d’Optique Appliquée)