High resolution, high sensitivity, X-ray phase contrast imaging obtained with a Hartmann mask based imaging system for mammography applications

Martin Piponnier

Presentation information

BISC2019

Oral Presentation

Advanced Microscopy II

Fri. Apr 26, 2019 1:30 PM - 3:00 PM 419 (Pacifico Yokohama Conference Center)

Session Chair:Izumi Nishidate(Tokyo University of Agriculture and Technology)

2:15 PM - 2:30 PM

[BISC-6-03] High resolution, high sensitivity, X-ray phase contrast imaging obtained with a Hartmann mask based imaging system for mammography applications

Martin Piponnier¹, Ombeline De La Rochefoucault¹, Guillaume Dovillaire¹, Fabrice Harms¹, Dietmar Korn¹, Jérôme Legrand¹, Xavier Levecq¹, Francesca Mastropietro², Lionel Nicolas¹, *Rakchanok Rungsawang¹ (1. Imagine Optic, 18 rue Charles de Gaulle, 91400 Orsay, France, 2. ALPhANOV, rue François Mitterrand, 33400 Talence, France)