Advanced Microscopy II

[BISC-6-03] High resolution, high sensitivity, X-ray phase contrast imaging obtained with a Hartmann mask based imaging system for mammography applications

Martin Piponnier¹, Ombeline De La Rochefoucault¹, Guillaume Dovillaire¹, Fabrice Harms¹, Dietmar Korn¹, Jérôme Legrand¹, Xavier Levecq¹, Francesca Mastropietro², Lionel Nicolas¹, *Rakchanok Rungsawang¹ (1. Imagine Optic, 18 rue Charles de Gaulle, 91400 Orsay, France, 2. ALPhANOV, rue François Mitterrand, 33400 Talence, France)