Schedule 2 3:50 PM - 5:00 PM [LEDIA-P-19] Structural analyses using TEM and XRD of GaInN films grown on GaN templates by RF-MBE *Soichiro Ohno1, Tomohiro Yamaguchi1, Hiroki Hirukawa1, Tsutomu Araki2, Hideki Hashimoto1, Takeyoshi Onuma1, Tohru Honda1 (1. Kogakuin University, 2. Ritsumeikan University)
