Short Oral Session

[LEDIA-P-19] Structural analyses using TEM and XRD of GaInN films grown on GaN templates by RF-MBE

*Soichiro Ohno¹, Tomohiro Yamaguchi¹, Hiroki Hirukawa¹, Tsutomu Araki², Hideki Hashimoto¹, Takeyoshi Onuma¹, Tohru Honda¹ (1. Kogakuin University, 2. Ritsumeikan University)