Imaging I

[XOPT-8-05] X-ray Reflecto-interferometry Based on Refractive Optics for Thin Films Characterization

*Irina Snigireva¹, Svetlana Lyatun², Dmitry Zverev², Petr Ershov², Ivan Lyatun², Oleg Konovalov¹, Anatoly Snigirev² (1. European Synchrotron Radiation Facility, 2. Immanuel Kant Baltic Federal University)