Schedule 1 10:30 AM - 12:00 PM [XOPT-P-02] In situ Long Trace Profiler Measurement For Bendable Gratings in the High Energy Resolution Soft X-ray Beamlines *Shangwei Lin1, Duan-Jen Wang1, Hok-Sum Fung1, Chih-Yu Hua1, Gung-Chian Yin1 (1. National Synchrotron Radiation Research Center)
