Poster Session

[XOPT-P-02] In situ Long Trace Profiler Measurement For Bendable Gratings in the High Energy Resolution Soft X-ray Beamlines

*Shangwei Lin¹, Duan-Jen Wang¹, Hok-Sum Fung¹, Chih-Yu Hua¹, Gung-Chian Yin¹ (1. National Synchrotron Radiation Research Center)