Poster Session

[XOPT-P-30] An in-line bent-crystal spectrometer for MID diagnostic end-station at European XFEL

Ulrike Boesenberg¹, Lewis Batchelor¹, Birthe Kist¹, Ilia Petrov¹, *Liubov Samoylova¹, Sergei Terentiev², Maurizio Vannoni¹, Harald Sinn¹, Anders Madsen¹ (1. European XFEL GmbH, 2. TISNCM - Technological Institute for Superhard and Novel Carbon Materials)