スケジュール 1 10:30 〜 12:00 [XOPT-P-40] New Developments in Microfocus Sources for X-ray Diffractometry *Frank Hertlein1, Uwe Heidorn1, Jörg Wiesmann1, Jürgen Graf1, Jenss Schmidt-May1, Carsten Michaelsen1 (1. incoatec GmbH)