Poster Session

[XOPT-P-41] Nanobeam diagnosis for XFEL sub-10nm focusing system

*Nami Nakamura¹, Satoshi Matsuyama¹, Takato Inoue¹, Hirokatsu Yumoto², Yuichi Inubushi^2,3, Takahisa Koyama², Taito Osaka³, Ichiro Inoue³, Kensuke Tono^2,3, Haruhiko Ohashi², Makina Yabashi^2,3, Tetsuya Ishikawa³, Kazuto Yamauchi¹ (1. Osaka University, 2. JASRI, 3. RIKEN SPring-8 Center)