XFEL (II)

Wed. Apr 22, 2020 3:30 PM - 4:45 PM 313+314 (Conference Center)

Session Chair: Satoshi Matsuyama(Osaka University)

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3:30 PM - 3:45 PM

[XOPT6-01] Pump-probe holographic imaging with femto-second FEL pulses of laser-induced cavitation bubbles

*Malte Vassholz¹, Hannes Paul Hoeppe¹, Johannes Hagemann³, Juan Manuel Rosselló², Markus Osterhoff¹, Andreas Schropp³, Robert Mettin², Frank Seiboth³, Christian G. Schroer³, Markus Scholz⁴, Johannes Möller⁴, Jörg Hallmann⁴, Ulrike Boesenberg⁴, Chan Kim⁴, Alexey Zozulya⁴, Wei Lu⁴, Roman Shayduk⁴, Robert Schaffer⁴, Anders Madsen⁴, Tim Salditt¹ (1. Institut für Röntgenphysik, University of Goettingen, 2. Drittes Physikalisches Institut, University of Goettingen, 3. Deutsches Elektronen-Synchrotron (DESY), 4. European XFEL GmbH)

3:45 PM - 4:15 PM

[XOPT6-02] Recent results and future perspectives in materials science at SACLA

*Yuya Kubota¹ (1. RIKEN SPring-8 Center)

4:15 PM - 4:30 PM

[XOPT6-03] Shortening pulse duration of X-ray free-elecron laser via saturable absorption

*Ichiro Inoue¹, Yuichi Inubushi^2,1, Taito Osaka¹, Jumpei Yamada¹, Kenji Tamasaku¹, Makina Yabashi^1,2 (1. RIKEN SPring-8 Center, 2. Japan Synchrotron Radiation Research Institute)

4:30 PM - 4:45 PM

[XOPT6-04] Intensity Autocorrelation Measurement at Angstrom Wavelength

*Taito Osaka¹, Ichiro Inoue¹, Jumpei Yamada¹, Shotaro Matsumura², Shota Nakano², Yuichi Inubushi^1,3, Kensuke Tono^1,3, Yasuhisa Sano², Kazuto Yamauchi², Kenji Tamasaku¹, Makina Yabashi^1,3 (1. RIKEN SPring-8 Center, 2. Osaka University, 3. Japan Synchrotron Radiation Research Institute)

Session information