Advanced Imaging and Sensors

[BISC5-06] Differential Mueller matrix formalism for reflectance configuration and high scattering medium

*Quoc-Hung Phan¹, Wei-Ze Xiao¹, You-Rui Lai¹, Tzu-Hsiang Jian¹, Thi-Thu-Hien Pham², Chi-Hsiang Lien¹ (1. National United University, 2. International University-Vietnam National University HCMC)