*Ryszard Buczynski1,2, Adam Filipkowski1, Hue Thi Nguyen1,2, Dariusz Pysz1, Ryszard Stepien1, Adrew J. Waddie3, Mo R. Taghizadeh3, Rafal Kasztelanic1,2
(1. Lukasiewicz - Institute of Electronic Materials Technology, 2. University of Warsaw, 3. Heriot-Watt University)