X-ray Optics (I)

[XOPT1-03] Precise wavefront measurement using grating interferometer for sub-10 nm XFEL focusing system

*Nami Nakamura¹, Satoshi Matsuyama¹, Jumpei Yamada², Takato Inoue¹, Taito Osaka², Hirokatsu Yumoto³, Takahisa Koyama³, Haruhiko Ohashi³, Makina Yabashi^2,3, Tetsuya Ishikawa², Kazuto Yamauchi¹ (1. Osaka University, 2. RIKEN SPring-8 Center, 3. JASRI)