XFEL (II)

[XOPT6-04] Intensity Autocorrelation Measurement at Angstrom Wavelength

*Taito Osaka¹, Ichiro Inoue¹, Jumpei Yamada¹, Shotaro Matsumura², Shota Nakano², Yuichi Inubushi^1,3, Kensuke Tono^1,3, Yasuhisa Sano², Kazuto Yamauchi², Kenji Tamasaku¹, Makina Yabashi^1,3 (1. RIKEN SPring-8 Center, 2. Osaka University, 3. Japan Synchrotron Radiation Research Institute)