*Nathan Christopher Palmquist¹, Stephen Gee¹, Srinivas Gandrothula¹, Xianqing Li¹, Steven P. Denbaars¹, Shuji Nakamura¹ (1. University of California, Santa Barbara)

*Motoaki Iwaya¹, Tatsunari Saito¹, Yoshinobu Suehiro¹, Tetsuya Takeuchi¹, Satoshi Kamiyama¹, Daisuke Iida², Kazuhiro Ohkawa² (1. Meijo University, 2. King Abdullah University of Science and Technology (KAUST))

*Stephan Haneder¹, Benjamin Schulz¹, Martin Unterburger¹, Florian Rommen¹, Vicknes R. Krishnan², Tsutomo Yazaki³ (1. ams OSRAM International GmbH, 2. ams OSRAM Penang, 3. ams OSRAM Japan Ltd)

*Charly Meyer¹, Sabrina Niemeyer¹, Sandra Gely¹, Taylor Robertson¹, Federico Duque Gomez¹, Kam Chow¹, Edward Tong¹, James Pond¹ (1. Ansys)

*Jie Hua Lai¹, Kai Hsun Chang^1,3, Bai Wei Wu¹, To Fan Pan¹, Ming Shun Tsai¹, Hung Hsiang Chiu², Chia Chun Fan¹, Safia Mohand Ousaid ³, Azzedine BOUDRIOUA³, Hiroyuki YOKOYAMA⁴, Eiji Higurashi⁴, Hidefumi AKIYAMA⁵, Chih Ming Lai⁶, Lung Han Peng^1,2 (1. Graduate Institute of Photonics and Optoelectronics, National Taiwan University, 2. Dept. Elec. Eng. National Taiwan University, Taipei 106, Taiwan, R.O.C., 3. Laboratoire de Physique de Lasers CNRS UMR 7538, Université Paris 13, Sorbonne Paris Cité,Villetaneuse, France, 4. Graduate school of engineering, Tohoku University, Aramaki Aza Aoba, Aoba-ku, Sendai, Miyagi 980-8579, Japan, 5. The Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan , 6. Electronic and optoelectronic system research laboratories, Industrial Technology Research Institute, Hsinchu, 310401, Taiwan)

*Urszula Joanna Blaszczak¹, Krzysztof Baran², Marian Gilewski¹, Lukasz Gryko¹, Marcin Lesko², Henryk Wachta², Maciej Zajkowski¹ (1. Bialystok University of Technology, 2. Rzeszow University of Technology)