OPTM2024 » Oral Presentation

Session 6

2024年4月23日(火) 15:30 〜 16:45 213 (Pacifico Yokohama Conference Center)

Session Chair: Markus Cornelius Schake, Motoharu Fujigaki (fujigaki@u-fukui.ac.jp)

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15:30 〜 16:00

[OPTM6-01(Invited)] Double-sided interferometer for precise thickness measurements

*Akiko Hirai¹, Youichi Bitou¹ (1. National Metrology Institute of Japan (NMIJ) / Advanced Industrial Science and Technology (AIST))

16:00 〜 16:15

[OPTM6-02] Implementation of the metrological characteristics framework using additively manufactured material measures

*Matthias Eifler^1,2,3, Julian Hering-Stratemeier^3,4, Georg von Freymann^3,4,5, Jörg Seewig^2,3 (1. IU International University of Applied Sciences, Erfurt, Germany, 2. Institute for Measurement and Sensor-Technology MTS, RPTU Kaiserslautern-Landau, Kaiserslautern, Germany, 3. Opti-Cal GmbH, Kaiserslautern, Germany, 4. Physics Department and State Research Center OPTIMAS, RPTU Kaiserslautern-Landau, Kaiserslautern, Germany, 5. Fraunhofer Institute for Industrial Mathematics ITWM, Kaiserslautern, Germany)

16:15 〜 16:30

[OPTM6-03] Spin Hall Effect of Light (SHEL) Ellipsometry for surface measurement with different models of optical interface

*Naila Zahra^1,2, Yasuhiro Mizutani¹, Tsutomu Uenohara¹, Yasuhiro Takaya¹ (1. Osaka University, 2. Institut Teknologi Bandung)

16:30 〜 16:45

[OPTM6-04] In-plane 2-dimensional displacement measurement using sinusoidal phase modulation interferometer

*Masato Higuchi¹, Taku Sato¹, Masato Aketagawa¹ (1. Nagaoka University of Technology)

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