[LEDIAp-13] High temperature and high speed growth of GaN by Cl2-based HVPE
Fairly high temperature growth of GaN using Cl2-based HVPE using GaCl was investigated on N-polar GaN. Compared with the distribution of tilt angles of dislocations in conventional HVPE, it was found that the number of dislocations with large tilt angles increased in fairly high temperature HVPE. These results suggest that HVPE of GaN above 1300 °C is essential for reducing dislocations for optoelectronic device applications.
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