OMC Poster Session

[OMCp-13] Selective Optical Manipulation of Nanoparticles for Emission Lines Using Stimulated Recoil Force

*Takao Horai¹, Takudo Wada², Yoshiki Saito¹, Yuto Makino^1,3, Masaaki Ashida¹, Hajime Ishihara¹ (1. Osaka University, 2. Osaka Prefecture University, 3. Daicel Corporation)

We propose an optical manipulation method to selectively target a particular emission line by using the recoil force generated when irradiating materials with induced light under their inverted-occupation conditions. We evaluated this force using a four-level system and performed a kinetic analysis to demonstrate emission-line selective manipulation.