[OMCp-13] Selective Optical Manipulation of Nanoparticles for Emission Lines Using Stimulated Recoil Force
We propose an optical manipulation method to selectively target a particular emission line by using the recoil force generated when irradiating materials with induced light under their inverted-occupation conditions. We evaluated this force using a four-level system and performed a kinetic analysis to demonstrate emission-line selective manipulation.
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