13:45 〜 14:15
[OPTM5-01(Invited)] Some Recent Work on Large Depth of Field 3D Microscopic Imaging Using Electrical Tunable Lens
In our pursuit of addressing the shallow depth of field (DOF) challenge in three-dimensional (3D) microscopic imaging without relying on a costly translational stage, we have employed an electrically tunable lens (ETL). The utilization of ETL presents a promising avenue for extending the DOF. Nevertheless, this introduces novel challenges in terms of system modeling, calibration, and image stitching.
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