Session 6

[OPTM6-03] Spin Hall Effect of Light (SHEL) Ellipsometry for surface measurement with different models of optical interface

*Naila Zahra^1,2, Yasuhiro Mizutani¹, Tsutomu Uenohara¹, Yasuhiro Takaya¹ (1. Osaka University, 2. Institut Teknologi Bandung)

The observation of Spin Hall Effect of Light (SHEL) using weak measurement leads to many application in various field including for precision measurement. This paper proposes SHEL ellipsometry for surface area measurement by raster scanning for smooth optics measurement. Three optics with different material and optical property are inspected.