Bonding Technology & ATLA Project - 3

[TILA-LIC8-02] DFC PowerChip optical properties for J-class amplifier system

*Arvydas Kausas^1,2, Akihiro Osanai¹, Vincent Yahia^2,1, Takunori Taira^1,2 (1. RIKEN SPring-8 Center, 2. Institute for Molecular Science)

We measured bulk laser induced damage threshold values for various sapphire and Nd:YAG crystals grown by different manufacturers. The connection between color center absorption and low damage threshold value in sapphire is considered to be the main source of lower damage threshold value.