Facility2 + Metrology

[XOPT3-04] Pulse profiles and impressions of Hard X-ray Free Electron Lasers

*Mikako Makita¹, Alexey Zozulya¹, Ulrike Boesenberg¹, Dmitrii Bespalov¹, Victorien Bouffetier^1,2, Felix Brausse¹, Christian David³, Joerg Hallmann¹, Talgat Mamyrbayev³, Kohei Miyanishi⁴, Daniel Mosko⁵, Johannes Moeller¹, Bob Nagler⁶, Motoaki Nakatsutsumi¹, Angel Rodriguez-Fernandez¹, Kristian Sabol⁵, Jan Patrik Schwinkendorf^1,8, Frank Seiboth⁷, Roman Shayduk¹, Peter Szeles⁵, Jozef Ulicny⁵, Patrik Vagovic⁷, Wenxin Wang⁷, James Wrigley¹, Mohamed Youssef¹, Toshinori Yabuuchi^4,9, Ulf Zastrau¹, Anders Madsen¹ (1. European XFEL GmbH, 2. ALBA Synchrotron Light Source, 3. Paul Scherrer Institut (PSI), 4. RIKEN Spring-8, 5. Pavol Jozef Safarik University, 6. SLAC National Accelerator Laboratory, 7. Deutsches Elektronen-Synchrotron (DESY), 8. Helmholtz-Zentrum Dresden-Rossendorf (HZDR), 9. Japan Synchrotron Radiation Research Institute (JASRI))

We present preliminary results of XFEL pulse assessments using Talbot and Ronchi shearing interferometries. Highlights includes SASE bandwidth wave front retrieval, X-ray focus reconstructions, optimization of phase-correction plate and sensitivity demonstration with hard X-ray puleses