16:15 〜 16:30
[XOPT4-04] Synchrotron- and substrate-induced modifications on beamline optical elements
We will show a study on two damaged optical element systems, from the Elettra synchrotron and the FERMI free electron laser facilities. The investigation was realized by means of Interferometry, AFM, XRD, Raman and IR Spectroscopy. The obtained results help understanding nature and causes of the damages and thus selecting the most suitable solutions to get rid of, or directly avoid them.
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