Imaging2

[XOPT7-04] Single-shot high-resolution in-line holography with XFEL

*Gota Yamaguchi¹, Jumpei Yamada², Atsuki Ito², Kota Shioi², Taito Osaka¹, Ichiro Inoue¹, Yuichi Inubushi^1,3, Takashi Kameshima^1,3, Kazuto Yamauchi², Makina Yabashi^1,3 (1. RIKEN SPring-8 Center, 2. Osaka University, 3. JASRI)

We are developing single-shot full-field phase-contrast imaging by combining the XFEL sub-10nm focusing system with in-line holography. The reconstructed image of Ag nanocubes indicated a spatial resolution of 10-20 nm. In this presentation, we report the status of our development and the results of preliminary experiments.