OPTICS & PHOTONICS International Congress 2024

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XOPT2024 » Oral Presentation

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2024年4月25日(木) 14:55 〜 16:00 313+314 (Pacifico Yokohama Conference Center)

Session Chair: Mikako Makita (European XFEL)

15:40 〜 15:55

[XOPT9-04] Using Shifting Based Automatic X-ray Inspection System to Estimate the Wire Thickness by Digital Tomosynthesis

*Yu-Hsuan Chien1, Chieh Shen1, Shih-Chun Jin1,2, Kun-Long Shih2, Chia-Wei Wang1, Jyh-Cheng Chen1 (1. National Yang Ming Chiao Tung University, 2. National Taipei University of Technology)

Automatic X-ray inspection (AXI) is crucial for printed circuit board (PCB) quality inspection, utilizing shift-and-add (SAA) for 2.5D reconstruction. Results reveal quantitative analyses, addressing X-ray challenges, providing insights for future industrial inspection optimization.

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