[XOPTp-11] Development of high-resolution X-ray microscope with multilayer AKB mirror for 17.5 keV X-ray
A high-resolution X-ray microscope was developed with a large-NA multilayer AKB mirror for 17.5 keV X-rays. A performance test conducted at SPring-8 demonstrated that minimum structure with 20 nm width of a test chart could be clearly resolved.
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