Simultaneous Monitoring of Strain and Temperature for Power Semiconductor using Single IR Camera (C000186)

Presentation information

Oral Session (Engineering)

Mon. Dec 14, 2020 10:00 AM - 12:10 PM Oral1 (Online)

10:20 AM - 10:30 AM

*Yoshiki Masuda¹, Akihiko Watabe¹, Ichiro Omura¹ (1. Kyushu Institute of Technology)

Keywords:Power semiconductor, Image correlation, Infrared camera