Symposium on Applied Engineering and Sciences (SAES2020)

講演情報

Poster Session (Engineering)

Poster(Engineering 2)

2020年12月15日(火) 15:00 〜 17:00 Poster1 (Online)

15:00 〜 17:00

[E-P2-07] SEB Failure Rate Calculation for High Power Semiconductor due to neutrons at aviation altitude (C000193)

*Srikanth Gollapudi1, Ichiro Omura1 (1. Kyushu Institute of Technology)

キーワード:failure rate, cosmic ray, failure cross section