[Tu-E] Poster Session

[Tu-E-06] Quantum critical phenomenon of CeS by electrical resistivity measurements under high pressure

*Yusaku Ozono¹, Harutaka Honda¹, Takeshi Matsumura¹, Masafumi Sera¹, Hiroshi Tanida², Akira Ochiai³ (1. Hiroshima University(Japan), 2. Toyama Prefectural University(Japan), 3. Tohoku University(Japan))

キーワード：valence fluctuation, Kondo effect