[Tu-E-17] Electronic Structure of YbNi2X2 (X=Si, Ge) Studied by Hard X-Ray Photoemission Spectroscopy
キーワード:valence fluctuation, Kondo lattice, hard x-ray photoemission spectroscopy
Poster Presentation
Poster Sessions
2019年9月24日(火) 16:45 〜 18:30 Exhibition Hall (2F, Okayama Convention Center)
Chair: K. Izawa, T. Matsuda, Y. Nakanishi
キーワード:valence fluctuation, Kondo lattice, hard x-ray photoemission spectroscopy