Poster

[AS-P-01] High resolution image acquired by deep sub-bottom profiling of small-scale features using complex attributes analysis on northeastern Hawaiian Arch

*Mikiya Yamashita^1,2, Seiichi Miura², Ryo Miura^2,3 (1. National Institute of Advanced Industrial Science and Technology (AIST) (Japan), 2. Japan Agency for Marine-Earth Science and Technology (JAMSTEC) (Japan), 3. Nippon Marine Enterprises, Ltd. (Japan))

In Hawaii region, there is one of the most important regions for exploring a complete sequence of the oceanic crust through the uppermost mantle as the challenging missions of scientific ocean drilling. It is important to evaluate the shallow detailed structure for understanding the stable condition such the deep ocean drilling.
Sub-Bottom Profiling (SBP) systems onboard many research vessels are simple tool to image and characterize geological a few meters structure below the sea floor.
We carried out SBP survey during Multi-channel seismic reflection (MCS) survey on northeastern Hawaiian Arch in east off Hawaiian Islands, 2017 in order to obtain the uppermost sedimentary structure for scientific drilling proposal. The water depth of survey line is 4400-5600m. Although the shallow structure obtained along the survey line by MCS survey is difficult to investigate the boundary between sediments and uppermost oceanic crust on the east part of survey line. Obtained original SBP data is not also good quality for understanding the shallow structure.
Therefore, we apply the reflection analysis technique for re-sampled SBP data. The continuous reflectors by applying complex attribute analysis are imaged from the SBP data. The boundary between acoustic basement and shallow sediments are identified from seismic envelope attributes. Detailed reflection phases are also detected from instantaneous frequency attributes. Our results show SBP data acquired by research vessels is important to image shallow detailed structure by applying our processing procedure.