*Futo Hashimoto¹, Toma Suzuki¹, Hideki Minari¹, Nobuya Nakazaki¹, Jun Komachi¹, Nobuyuki Sano² (1. Sony Semiconductor Solutions Corp., 2. Univ. of Tsukuba)

Jeremy Grebot^2,3, Rémi Helleboid^1,2, Gabriel Mugny², Isobel Nicholson², Louis Henri Fernandez-Mouron², Stephane Lanteri³, *Denis Rideau² (1. Université Paris-Saclay, CNRS, Centre de Nanosciences et de Nanotechnologies, 2. STMicroelectronics, Crolles, France - Edinburgh, United-Kingdom, 3. UCA, Inria, CNRS, LJAD, Inria Research Center, Sophia Antipolis France)

*Rémi Helleboid^1,2, Jérôme Saint-Martin¹, Marco Pala¹, Philippe Dollfus¹, Jeremy Grebot², Gabriel Mugny², Isobel Nicholson², Denis Rideau² (1. Université Paris-Saclay, CNRS, Centre de Nanosciences et de Nanotechnologies, 2. STMicroelectronics, Crolles, France - Edinburgh, United-Kingdom)

Gabriel Mugny², *Denis Rideau¹, Arthur Arnaud¹, Jeremy Grebot¹, Rémi Helleboid¹, Isobel Nicholson² (1. STMicroelectronics, Technology and Design Platforms, France, 2. STMicroelectronics, Imaging Division, France)

*Naveen Kumar¹, César Pascual García², Ali Rezaei¹, Ankit Dixit¹, Asen Asenov¹, Vihar Georgiev¹ (1. University of Glasgow, 2. Luxembourg Institute of Science and Technology)