SISPAD2023

Presentation information

Print

Oral

[Session 5] Interface and Reliability/Variability

Thu. Sep 28, 2023 9:00 AM - 11:30 AM Hall A

Chair: Hiu-Yung Wong (San Jose State Univ.), Nobuhiko Nakano (Keio Univ.)

9:00 AM - 9:30 AM

[Session_5-01] 【Invited】Modeling Degradation and Breakdown in SiO2 and High-k Gate Dielectrics

*Andrea Padovani1, Paolo La Torraca1, Luca Larcher2, Jack Strand3, Alexander Shluger3 (1. University of Modena and Reggio Emilia, 2. Applied Materials, 3. University of College London)

Abstract password authentication.
Password is required to view the abstract. Please enter a password to authenticate.

Password