[Session 7] Traps and Defects

[Session_7-02] Quantum Modeling of Semiconductor Leakage Currents Induced by Defects

Antoine Jay¹, Clément Mesnard¹, Isobel Nicholson², Rémi Helleboid², Gabriel Mugny², *Denis Rideau², Vincent Goiffon³, Layla Martin-Samo⁵, Nicolas Richard⁴, Anne Hémeryck¹ (1. Lab. d'analyse et d'architecture des systèmes, CNRS, Univ. de Toulouse, 2. ST Microelectronics, 3. ISAE-SUPAERO, 4. CEA/DIF, Bruyères-le-Châtel, 5. CNR-IOM, Democritos National Simulation Center, Istituto Officina dei Materiali, c/o SISSA)