[10] Memory Technology

[10-02] Record-High Memory Window and Robust Retention Anti-Fuse OTP Memory: Electrical and Reliability Characteristics

Dong Ru Hsieh¹, *Jia Chian Ni¹, Wei Ju Yeh¹, Tzu Chieh Hong¹, Zi Yang Hong¹, Yan Kui Liang¹, Huai En Luo¹, Michael Hsu¹, Ta Chun Cho², Tien Sheng Chao¹ (1. National Yang Ming Chiao Tung Univ. (Taiwan), 2. Taiwan Semiconductor Res. Inst. (Taiwan))