10:35 AM - 10:50 AM
[3B04] Pulse-height defects of silicon semiconductor detectors for heavy-ion measurements
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基盤セッション 計測・検出器
基盤セッション I: 検出器・計測・イメージング
Sat. Sep 17, 2022 9:40 AM - 11:05 AM B会場 (206室)
Chair:Yoshio Takahashi, Masato Asai(Japan Atomic Energy Agency)
10:35 AM - 10:50 AM
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