[PS-2-14] Impact and Improvement of Resistor Process Variation on RF Passive Circuit Design in Integrated Passive Devices (IPD) Technology

^○Y. C. Chang^1,2, P. Y. Wang¹, S. H. Hsu¹, Y. T. Chang³, C. K. Chen³, D. C. Chang² (1.National Tsing Hua Univ., 2.National Chip Implementation Center, National Applied Res. Labs., 3.Bureau of Standards, Metrology and Inspection, MOEA(Taiwan))

https://doi.org/10.7567/SSDM.2015.PS-2-14