The Japan Society of Applied Physics

2:00 PM - 2:20 PM

[E-1-02] Comprehensive Analysis of Low-frequency Noise Variability Components in Bulk and FDSOI (SOTB) MOSFETs

K. Maekawa1, H. Makiyama1, Y. Yamamoto1, T. Hasegawa1, S. Okanishi1, K. Sonoda1, H. Shinkawata1, T. Yamashita1, S. Kamohara1, Y. Yamaguchi1 (1.Renesas Electronics Corp. (Japan))

https://doi.org/10.7567/SSDM.2017.E-1-02