2018 International Conference on Solid State Devices and Materials

Presentation information

Oral Presentation

11: Advanced Materials Synthesis and Advanced Characterization

[E-3] Characterizations of Gate Dielectrics

Wed. Sep 12, 2018 9:00 AM - 10:30 AM Room 222 (School of Engineering Bldg.2 North Wing second floor)

Session Chair: S. Ogawa(Toray Research Center, Inc.), J. Chen(NIMS)

9:00 AM - 9:30 AM

[E-3-01 (Invited)] Photoemission Study of Gate Dielectrics and Stack Interfaces

S. Miyazaki1, A. Ohta1 (1. Nagoya Univ.(Japan))