11:30 AM - 11:45 AM

[A-6-04] Experimental study of bias stress degradation of organic thin film transistors

^○K. Oshima¹, M. Saito¹, M. Shintani², K. Kuribara³, Y. Ogasahara³, T. Sato¹ (1.Kyoto Univ. (Japan), 2.NAIST (Japan), 3.AIST (Japan))

https://doi.org/10.7567/SSDM.2019.A-6-04